Conference Proceedings
Home
 > 
Browse by Publisher
 > 
Institute of Electrical and Electronics Engineers ( IEEE )
 > 
ADVANCES IN SYSTEM TESTING AND VALIDATION LIFECYCLE. INTERNATIONAL CONFERENCE. 1ST 2009. (VALID 2009) (CD-ROM)

ADVANCES IN SYSTEM TESTING AND VALIDATION LIFECYCLE. INTERNATIONAL CONFERENCE. 1ST 2009. (VALID 2009) (CD-ROM)

Send a Friend    
ADVANCES IN SYSTEM TESTING AND VALIDATION LIFECYCLE. INTERNATIONAL CONFERENCE. 1ST 2009. (VALID 2009) (CD-ROM)
Item #: 06375
Our Price:   
$200.00
Pricing: IEEE Member # :
Product Description
Title:2009 First International Conference on Advances in System Testing and Validation Lifecycle (VALID 2009)
Desc:Proceedings of a meeting held 20-25 September 2009, Porto, Portugal.
Sponsor:Institute of Electrical and Electronics Engineers ( IEEE )
Prod#:CFP0971H-CDR
ISBN:9780769537740
Pages:0
Format:Cd-Rom
Publisher:Institute of Electrical and Electronics Engineers ( IEEE )
Notes: Authorized distributor of all IEEE proceedings
Related Products
Browse By PublisherShop By Category
Find Us On Facebook
Dave A Curran, EzineArticles.com Basic Author