ADVANCES IN SYSTEM TESTING AND VALIDATION LIFECYCLE. INTERNATIONAL CONFERENCE. 1ST 2009. (VALID 2009) (CD-ROM)

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Title:	2009 First International Conference on Advances in System Testing and Validation Lifecycle (VALID 2009)
Desc:	Proceedings of a meeting held 20-25 September 2009, Porto, Portugal.
Sponsor:	Institute of Electrical and Electronics Engineers ( IEEE )
Prod#:	CFP0971H-CDR
ISBN:	9780769537740
Pages:	0
Format:	Cd-Rom
Publisher:	Institute of Electrical and Electronics Engineers ( IEEE )
Notes:	Authorized distributor of all IEEE proceedings