TEST CONFERENCE. INTERNATIONAL. 2009. (ITC 2009) (CD-ROM)

TEST CONFERENCE. INTERNATIONAL. 2009. (ITC 2009) (CD-ROM)

Item #:
008065
$144.00 - $288.00
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Details

  • Title: 2009 International Test Conference (ITC 2009)
  • Date/Location: Held 1-6 November 2009, Austin, Texas, USA.
  • IEEE #: CFP09ITC-CDR
  • ISBN: 9781424448678
  • Format: CD-ROM
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jun 2010 )

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Tab 4

 
  • Title: 2009 International Test Conference (ITC 2009)
  • Date/Location: Held 1-6 November 2009, Austin, Texas, USA.
  • IEEE #: CFP09ITC-CDR
  • ISBN: 9781424448678
  • Format: CD-ROM
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jun 2010 )