DESIGN TEST INTEGRATION AND PACKAGING OF MEMS/MOEMS. SYMPOSIUM. 2010. (DTIP 2010)

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008346
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  • Title: 2010 Symposium on Design Test Integration and Packaging of MEMS/MOEMS (DTIP 2010)
  • Date/Location: Held 5-7 May 2010, Seville, Spain.
  • Editor: Courtois, B.
  • IEEE #: CFP10DTI-POD
  • ISBN: 9781424466368
  • Pages: 396 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jul 2010 )

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  • Title: 2010 Symposium on Design Test Integration and Packaging of MEMS/MOEMS (DTIP 2010)
  • Date/Location: Held 5-7 May 2010, Seville, Spain.
  • Editor: Courtois, B.
  • IEEE #: CFP10DTI-POD
  • ISBN: 9781424466368
  • Pages: 396 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jul 2010 )