VLSI DESIGN, AUTOMATION AND TEST. INTERNATIONAL SYMPOSIUM. 2010. (VLSI-DAT 2010) (CD-ROM)

VLSI DESIGN, AUTOMATION AND TEST. INTERNATIONAL SYMPOSIUM. 2010. (VLSI-DAT 2010) (CD-ROM)

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008491
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Details

  • Title: 2010 International Symposium on VLSI Design, Automation and Test (VLSI-DAT 2010)
  • Date/Location: Held 26-29 April 2010, Hsin Chu, Taiwan.
  • IEEE #: CFP10847-CDR
  • ISBN: 9781424452712
  • Format: CD-ROM
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jul 2010 )

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Tab 4

 
  • Title: 2010 International Symposium on VLSI Design, Automation and Test (VLSI-DAT 2010)
  • Date/Location: Held 26-29 April 2010, Hsin Chu, Taiwan.
  • IEEE #: CFP10847-CDR
  • ISBN: 9781424452712
  • Format: CD-ROM
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jul 2010 )