Details
- Title: 2010 Second International Conference on Advances in System Testing and Validation Lifecycle (VALID 2010)
- Date/Location: Held 22-27 August 2010, Nice, France.
- Editor: DuBousquest, L.
- IEEE #: CFP1071H-POD
- ISBN: 9781424477845
- Pages: 129 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Dec 2010 )
Description
Members/Attendees
Tab 4
- Title: 2010 Second International Conference on Advances in System Testing and Validation Lifecycle (VALID 2010)
- Date/Location: Held 22-27 August 2010, Nice, France.
- Editor: DuBousquest, L.
- IEEE #: CFP1071H-POD
- ISBN: 9781424477845
- Pages: 129 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Dec 2010 )