ADVANCES IN SYSTEM TESTING AND VALIDATION LIFECYCLE. INTERNATIONAL CONFERENCE. 2ND 2010. (VALID 2010)

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Title:	2010 Second International Conference on Advances in System Testing and Validation Lifecycle (VALID 2010)
Desc:	Proceedings of a meeting held 22-27 August 2010, Nice, France.
Prod#:	CFP1071H-POD
ISBN:	9781424477845
Pages:	129 (1 Vol)
Format:	Softcover
Notes:	Authorized distributor of all IEEE proceedings
TOC:	View Table of Contents
Publ:	Institute of Electrical and Electronics Engineers ( IEEE )
POD Publ:	Curran Associates, Inc. ( Dec 2010 )