 Title: | 2010 Second International Conference on Advances in System Testing and Validation Lifecycle (VALID 2010) | Desc: | Proceedings of a meeting held 22-27 August 2010, Nice, France.
| Prod#: | CFP1071H-POD | ISBN: | 9781424477845 | Pages: | 129 (1 Vol) | Format: | Softcover | Notes: | Authorized distributor of all IEEE proceedings | TOC: | View Table of Contents | Publ: | Institute of Electrical and Electronics Engineers ( IEEE ) | POD Publ: | Curran Associates, Inc. ( Dec 2010 ) |
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