DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS. IEEE INTERNATIONAL SYMPOSIUM. 25TH 2010. (DFT 2010)

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009781
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  • Title: 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2010)
  • Date/Location: Held 6-8 October 2010, Kyoto, Japan.
  • Editor: Chapman, G.
  • IEEE #: CFP10078-POD
  • ISBN: 9781424484478
  • Pages: 449 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jan 2011 )

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  • Title: 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2010)
  • Date/Location: Held 6-8 October 2010, Kyoto, Japan.
  • Editor: Chapman, G.
  • IEEE #: CFP10078-POD
  • ISBN: 9781424484478
  • Pages: 449 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jan 2011 )