Details
- Title: 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2010)
- Date/Location: Held 6-8 October 2010, Kyoto, Japan.
- Editor: Chapman, G.
- IEEE #: CFP10078-POD
- ISBN: 9781424484478
- Pages: 449 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jan 2011 )
Description
Members/Attendees
Tab 4
- Title: 2010 IEEE 25th International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2010)
- Date/Location: Held 6-8 October 2010, Kyoto, Japan.
- Editor: Chapman, G.
- IEEE #: CFP10078-POD
- ISBN: 9781424484478
- Pages: 449 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jan 2011 )