ADVANCES IN SYSTEM TESTING AND VALIDATION LIFECYCLE. INTERNATIONAL CONFERENCE. 2ND 2010. (VALID 2010) (CD-ROM)

ADVANCES IN SYSTEM TESTING AND VALIDATION LIFECYCLE. INTERNATIONAL CONFERENCE. 2ND 2010. (VALID 2010) (CD-ROM)

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010155
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Details

  • Title: 2010 Second International Conference on Advances in System Testing and Validation Lifecycle (VALID 2010)
  • Date/Location: Held 22-27 August 2010, Nice, France.
  • IEEE #: CFP1071H-CDR
  • ISBN: 9780769541464
  • Format: CD-ROM
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Dec 2010 )

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  • Title: 2010 Second International Conference on Advances in System Testing and Validation Lifecycle (VALID 2010)
  • Date/Location: Held 22-27 August 2010, Nice, France.
  • IEEE #: CFP1071H-CDR
  • ISBN: 9780769541464
  • Format: CD-ROM
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Dec 2010 )