Title: | 2010 Second International Conference on Advances in System Testing and Validation Lifecycle (VALID 2010) |
Desc: | Proceedings of a meeting held 22-27 August 2010, Nice, France.
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Prod#: | CFP1071H-CDR |
ISBN: | 9780769541464 |
Pages: | 0 |
Format: | CD-ROM |
Notes: | Authorized distributor of all IEEE proceedings |
Publ: | Institute of Electrical and Electronics Engineers ( IEEE ) |
POD Publ: | Curran Associates, Inc. ( Dec 2010 ) |