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ADVANCES IN SYSTEM TESTING AND VALIDATION LIFECYCLE. INTERNATIONAL CONFERENCE. 2ND 2010. (VALID 2010) (CD-ROM)

ADVANCES IN SYSTEM TESTING AND VALIDATION LIFECYCLE. INTERNATIONAL CONFERENCE. 2ND 2010. (VALID 2010) (CD-ROM)

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ADVANCES IN SYSTEM TESTING AND VALIDATION LIFECYCLE. INTERNATIONAL CONFERENCE. 2ND 2010. (VALID 2010) (CD-ROM)
Item #: 10155
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Product Description
Title:2010 Second International Conference on Advances in System Testing and Validation Lifecycle (VALID 2010)
Desc:Proceedings of a meeting held 22-27 August 2010, Nice, France.
Prod#:CFP1071H-CDR
ISBN:9780769541464
Pages:0
Format:CD-ROM
Notes: Authorized distributor of all IEEE proceedings
Publ:Institute of Electrical and Electronics Engineers ( IEEE )
POD Publ:Curran Associates, Inc. ( Dec 2010 )
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