Details
- Title: 2013 Far East Forum on Nondestructive Evaluation/Testing: New Technology & Application (FENDT 2013)
- Date/Location: Held 17-20 June 2013, Jinan, China.
- Editor: Xu, C.
- IEEE #: CFP1310U-POD
- ISBN: 9781467360173
- Pages: 230 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Nov 2013 )
Description
Members/Attendees
Tab 4
- Title: 2013 Far East Forum on Nondestructive Evaluation/Testing: New Technology & Application (FENDT 2013)
- Date/Location: Held 17-20 June 2013, Jinan, China.
- Editor: Xu, C.
- IEEE #: CFP1310U-POD
- ISBN: 9781467360173
- Pages: 230 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Nov 2013 )