Details
- Title: 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS 2015)
- Date/Location: Held 12-14 October 2015, Amherst, Massachusetts, USA.
- IEEE #: CFP15078-POD
- ISBN: 9781479986316
- Pages: 236 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Dec 2015 )
Description
Members/Attendees
Tab 4
- Title: 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS 2015)
- Date/Location: Held 12-14 October 2015, Amherst, Massachusetts, USA.
- IEEE #: CFP15078-POD
- ISBN: 9781479986316
- Pages: 236 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Dec 2015 )