 Title: | Analytical Techniques for Semiconductor Materials and Process Characterization 6 (ALTECH 2009) | Desc: | Proceedings of a meeting held 4-9 October 2009, Vienna, Austria.
216th ECS Meeting | Series: | ECS Transactions Volume 25 No.03 | Editor: | Kolbesen, B. O. et al. | ISBN: | 9781607680901 | Pages: | 465 (1 Vol) | Format: | Softcover | TOC: | View Table of Contents | Publ: | Electrochemical Society ( ECS ) | POD Publ: | Curran Associates, Inc. ( Aug 2017 ) |
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