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ANALYTICAL TECHNIQUES FOR SEMICONDUCTOR MATERIALS AND PROCESS CHARACTERIZATION 6. (ALTECH 2009) (216TH ECS MEETING)

ANALYTICAL TECHNIQUES FOR SEMICONDUCTOR MATERIALS AND PROCESS CHARACTERIZATION 6. (ALTECH 2009) (216TH ECS MEETING)

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ANALYTICAL TECHNIQUES FOR SEMICONDUCTOR MATERIALS AND PROCESS CHARACTERIZATION 6. (ALTECH 2009) (216TH ECS MEETING)
Item #: 35592
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Product Description
Title:Analytical Techniques for Semiconductor Materials and Process Characterization 6 (ALTECH 2009)
Desc:Proceedings of a meeting held 4-9 October 2009, Vienna, Austria. 216th ECS Meeting
Series:ECS Transactions Volume 25 No.03
Editor:Kolbesen, B. O. et al.
ISBN:9781607680901
Pages:465 (1 Vol)
Format:Softcover
TOC:View Table of Contents
Publ:Electrochemical Society ( ECS )
POD Publ:Curran Associates, Inc. ( Aug 2017 )
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