ANALYTICAL TECHNIQUES FOR SEMICONDUCTOR MATERIALS AND PROCESS CHARACTERIZATION 6. (ALTECH 2009) (216TH ECS MEETING)

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035592
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  • Title: Analytical Techniques for Semiconductor Materials and Process Characterization 6 (ALTECH 2009)
  • Subtitle: 216th ECS Meeting
  • Date/Location: Held 4-9 October 2009, Vienna, Austria.
  • Series: ECS Transactions Volume 25 No.03
  • Editor: Kolbesen, B. O. et al.
  • ISBN: 9781607680901
  • Pages: 465 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Electrochemical Society (ECS)
  • POD Publisher: Curran Associates, Inc. ( Aug 2017 )

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Tab 4

 
  • Title: Analytical Techniques for Semiconductor Materials and Process Characterization 6 (ALTECH 2009)
  • Subtitle: 216th ECS Meeting
  • Date/Location: Held 4-9 October 2009, Vienna, Austria.
  • Series: ECS Transactions Volume 25 No.03
  • Editor: Kolbesen, B. O. et al.
  • ISBN: 9781607680901
  • Pages: 465 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Electrochemical Society (ECS)
  • POD Publisher: Curran Associates, Inc. ( Aug 2017 )