 Title: | Ninth International Conference on Advances in System Testing and Validation Lifecycle (VALID 2017) | Desc: | Proceedings of a meeting held 8-12 October 2017, Athens, Greece.
Held at SoftNet 2017 | Editor: | Gu, X. et al. | ISBN: | 9781510851450 | Pages: | 17 (1 Vol) | Format: | Softcover | TOC: | View Table of Contents | Publ: | International Academy, Research, and Industry Association ( IARIA ) | POD Publ: | Curran Associates, Inc. ( Jan 2018 ) |
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