Details
- Title: 2020 IEEE Workshop Celebrating the Scientific Value of Failure (FailFest 2020)
- Date/Location: Held 25 October 2020, Salt Lake City, Utah, USA.
- IEEE #: CFP20Z02-POD
- ISBN: 9781728185576
- Pages: 11 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2021 )
Description
Members/Attendees
Tab 4
- Title: 2020 IEEE Workshop Celebrating the Scientific Value of Failure (FailFest 2020)
- Date/Location: Held 25 October 2020, Salt Lake City, Utah, USA.
- IEEE #: CFP20Z02-POD
- ISBN: 9781728185576
- Pages: 11 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2021 )