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ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS VII

ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS VII

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ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS VII
Item #: 46568
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Product Description
Title:Advances in Metrology for X-Ray and EUV Optics VII
Desc:Proceedings of a meeting held 6-7 August 2017, San Diego, California, USA. At SPIE Optical Engineering + Applications
Series:Proceedings of SPIE Volume 10385
Editor:Assoufid, Lahsen
ISBN:9781510612273
Pages:178 (1 Vol) (approx)
Format:Softcover
Publ:SPIE - International Society For Optics and Photonics
POD Publ:Curran Associates, Inc. ( Oct 2017 )
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