2017 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS

Item #: 46792

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Title:	2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Desc:	Proceedings of a meeting held 28-30 October 2017, Beijing, China.
Series:	Proceedings of SPIE Volume 10621
Editor:	Zhu, Jigui
ISBN:	9781510617537
Pages:	686 (1 Vol)
Format:	Softcover
TOC:	View Table of Contents
Publ:	SPIE - International Society for Optics and Photonics
POD Publ:	Curran Associates, Inc. ( Jan 2018 )