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2017 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS

2017 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS

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2017 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS
Item #: 46792
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Product Description
Title:2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Desc:Proceedings of a meeting held 28-30 October 2017, Beijing, China.
Series:Proceedings of SPIE Volume 10621
Editor:Zhu, Jigui
ISBN:9781510617537
Pages:686 (1 Vol)
Format:Softcover
TOC:View Table of Contents
Publ:SPIE - International Society For Optics and Photonics
POD Publ:Curran Associates, Inc. ( Jan 2018 )
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