APPLIED OPTICAL METROLOGY III

APPLIED OPTICAL METROLOGY III

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051220
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Details

  • Title: Applied Optical Metrology III
  • Subtitle: At SPIE Optical Engineering + Applications
  • Date/Location: Held 13-15 August 2019, San Diego, California, USA.
  • Series: Proceedings of SPIE Volume 11102
  • Editor: Novak, Erik
  • ISBN: 9781510628977
  • Pages: 424 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Nov 2019 )

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  • Title: Applied Optical Metrology III
  • Subtitle: At SPIE Optical Engineering + Applications
  • Date/Location: Held 13-15 August 2019, San Diego, California, USA.
  • Series: Proceedings of SPIE Volume 11102
  • Editor: Novak, Erik
  • ISBN: 9781510628977
  • Pages: 424 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Nov 2019 )