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APPLIED OPTICAL METROLOGY III

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APPLIED OPTICAL METROLOGY III
Item #: 51220
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Product Description
Title:Applied Optical Metrology III
Desc:Proceedings of a meeting held 13-15 August 2019, San Diego, California, USA. At SPIE Optical Engineering + Applications
Series:Proceedings of SPIE Volume 11102
Editor:Novak, Erik
ISBN:9781510628977
Pages:424 (1 Vol)
Format:Softcover
TOC:View Table of Contents
Publ:SPIE - International Society For Optics and Photonics
POD Publ:Curran Associates, Inc. ( Nov 2019 )
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