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ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS VIII

ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS VIII

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ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS VIII
Item #: 50799
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Product Description
Title:Advances in Metrology for X-Ray and EUV Optics VIII
Desc:Proceedings of a meeting held 11-12 August 2019, San Diego, California, USA. At SPIE Optical Engineering + Applications
Series:Proceedings of SPIE Volume 11109
Editor:Assoufid, Lahsen
ISBN:9781510629110
Pages:196 (1 Vol)
Format:Softcover
TOC:View Table of Contents
Publ:SPIE - International Society For Optics and Photonics
POD Publ:Curran Associates, Inc. ( Oct 2019 )
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