 | Title: | Advances in Metrology for X-Ray and EUV Optics VIII | | Desc: | Proceedings of a meeting held 11-12 August 2019, San Diego, California, USA.
At SPIE Optical Engineering + Applications | | Series: | Proceedings of SPIE Volume 11109 | | Editor: | Assoufid, Lahsen | | ISBN: | 9781510629110 | | Pages: | 196 (1 Vol) | | Format: | Softcover | | TOC: | View Table of Contents | | Publ: | SPIE - International Society for Optics and Photonics | | POD Publ: | Curran Associates, Inc. ( Oct 2019 ) |
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