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ADVANCED OPTICAL TECHNIQUES FOR QUANTUM INFORMATION, SENSING, AND METROLOGY

ADVANCED OPTICAL TECHNIQUES FOR QUANTUM INFORMATION, SENSING, AND METROLOGY

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ADVANCED OPTICAL TECHNIQUES FOR QUANTUM INFORMATION, SENSING, AND METROLOGY
Item #: 54278
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Product Description
Title:Advanced Optical Techniques for Quantum Information, Sensing, and Metrology
Desc:Proceedings of a meeting held 4-5 February 2020, San Francisco, California, USA. At SPIE OPTO
Series:Proceedings of SPIE Volume 11295
Editor:Hemmer, Philip R.
ISBN:9781510633537
Pages:92 (1 Vol)
Format:Softcover
TOC:View Table of Contents
Publ:SPIE - International Society for Optics and Photonics
POD Publ:Curran Associates, Inc. ( Jun 2020 )
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