ADVANCED OPTICAL TECHNIQUES FOR QUANTUM INFORMATION, SENSING, AND METROLOGY

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054278
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  • Title: Advanced Optical Techniques for Quantum Information, Sensing, and Metrology
  • Subtitle: At SPIE OPTO
  • Date/Location: Held 4-5 February 2020, San Francisco, California, USA.
  • Series: Proceedings of SPIE Volume 11295
  • Editor: Hemmer, Philip R.
  • ISBN: 9781510633537
  • Pages: 92 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jun 2020 )

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  • Title: Advanced Optical Techniques for Quantum Information, Sensing, and Metrology
  • Subtitle: At SPIE OPTO
  • Date/Location: Held 4-5 February 2020, San Francisco, California, USA.
  • Series: Proceedings of SPIE Volume 11295
  • Editor: Hemmer, Philip R.
  • ISBN: 9781510633537
  • Pages: 92 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Jun 2020 )