 | Title: | Advanced Optical Techniques for Quantum Information, Sensing, and Metrology | | Desc: | Proceedings of a meeting held 4-5 February 2020, San Francisco, California, USA.
At SPIE OPTO | | Series: | Proceedings of SPIE Volume 11295 | | Editor: | Hemmer, Philip R. | | ISBN: | 9781510633537 | | Pages: | 92 (1 Vol) | | Format: | Softcover | | TOC: | View Table of Contents | | Publ: | SPIE - International Society for Optics and Photonics | | POD Publ: | Curran Associates, Inc. ( Jun 2020 ) |
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