 Title: | Advanced Optical Techniques for Quantum Information, Sensing, and Metrology | Desc: | Proceedings of a meeting held 4-5 February 2020, San Francisco, California, USA.
At SPIE OPTO | Series: | Proceedings of SPIE Volume 11295 | Editor: | Hemmer, Philip R. | ISBN: | 9781510633537 | Pages: | 92 (1 Vol) | Format: | Softcover | TOC: | View Table of Contents | Publ: | SPIE - International Society for Optics and Photonics | POD Publ: | Curran Associates, Inc. ( Jun 2020 ) |
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