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2019 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS

2019 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS

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2019 INTERNATIONAL CONFERENCE ON OPTICAL INSTRUMENTS AND TECHNOLOGY: OPTOELECTRONIC MEASUREMENT TECHNOLOGY AND SYSTEMS
Item #: 53573
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Product Description
Title:2019 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems
Desc:Proceedings of a meeting held 26-28 October 2019, Beijing, China.
Series:Proceedings of SPIE Volume 11439
Editor:Zhu, Jigui
ISBN:9781510636569
Pages:560 (1 Vol)
Format:Softcover
TOC:View Table of Contents
Publ:SPIE - International Society for Optics and Photonics
POD Publ:Curran Associates, Inc. ( May 2020 )
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