ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS IX

ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS IX

Item #:
056054
Our Price: $90.00
Adding to cart… The item has been added

Details

  • Title: Advances in Metrology for X-Ray and EUV Optics IX
  • Subtitle: At SPIE Optical Engineering + Applications
  • Date/Location: Held 24 August - 4 September 2020, Online.
  • Series: Proceedings of SPIE Volume 11492
  • Editor: Assoufid, Lahsen
  • ISBN: 9781510637900
  • Pages: 154 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Oct 2020 )

Description

 

Members/Attendees

 

Tab 4

 
  • Title: Advances in Metrology for X-Ray and EUV Optics IX
  • Subtitle: At SPIE Optical Engineering + Applications
  • Date/Location: Held 24 August - 4 September 2020, Online.
  • Series: Proceedings of SPIE Volume 11492
  • Editor: Assoufid, Lahsen
  • ISBN: 9781510637900
  • Pages: 154 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: SPIE - International Society for Optics and Photonics
  • POD Publisher: Curran Associates, Inc. ( Oct 2020 )