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ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS IX

ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS IX

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ADVANCES IN METROLOGY FOR X-RAY AND EUV OPTICS IX
Item #: 56054
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Product Description
Title:Advances in Metrology for X-Ray and EUV Optics IX
Desc:Proceedings of a meeting held 24 August - 4 September 2020, Online. At SPIE Optical Engineering + Applications
Series:Proceedings of SPIE Volume 11492
Editor:Assoufid, Lahsen
ISBN:9781510637900
Pages:154 (1 Vol)
Format:Softcover
TOC:View Table of Contents
Publ:SPIE - International Society for Optics and Photonics
POD Publ:Curran Associates, Inc. ( Oct 2020 )
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