Details
- Title: 2007 IEEE International Test Conference
- Date/Location: Held 21-26 October 2007, Santa Clara, California.
- IEEE #: CFP07ITC-POD
- ISBN: 9781424411276
- Pages: 1,050 (2 Vols)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jun 2008 )
Description
Members/Attendees
Tab 4
- Title: 2007 IEEE International Test Conference
- Date/Location: Held 21-26 October 2007, Santa Clara, California.
- IEEE #: CFP07ITC-POD
- ISBN: 9781424411276
- Pages: 1,050 (2 Vols)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jun 2008 )