Details
- Title: 26th IEEE VLSI Test Symposium (VTS 2008)
- Date/Location: Held 27 April - 1 May 2008, San Diego, California.
- IEEE #: CFP08029-POD
- ISBN: 9780769531236
- Pages: 413 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Sep 2008 )
Description
Members/Attendees
Tab 4
- Title: 26th IEEE VLSI Test Symposium (VTS 2008)
- Date/Location: Held 27 April - 1 May 2008, San Diego, California.
- IEEE #: CFP08029-POD
- ISBN: 9780769531236
- Pages: 413 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Sep 2008 )