Details
- Title: 2007 IEEE International Workshop on Memory Technology, Design and Testing
- Date/Location: Held 3-5 December 2007, Taipei, Taiwan.
- IEEE #: CFP07028-POD
- ISBN: 9781424416561
- Pages: 79 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Sep 2008 )
Description
Members/Attendees
Tab 4
- Title: 2007 IEEE International Workshop on Memory Technology, Design and Testing
- Date/Location: Held 3-5 December 2007, Taipei, Taiwan.
- IEEE #: CFP07028-POD
- ISBN: 9781424416561
- Pages: 79 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Sep 2008 )