Details
- Title: 2008 17th Asian Test Symposium (ATS)
- Date/Location: Held 24-27 November 2008, Hokkaido, Japan.
- IEEE #: CFP08067-POD
- ISBN: 9781424440030
- Pages: 392 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( May 2009 )
Description
Members/Attendees
Tab 4
- Title: 2008 17th Asian Test Symposium (ATS)
- Date/Location: Held 24-27 November 2008, Hokkaido, Japan.
- IEEE #: CFP08067-POD
- ISBN: 9781424440030
- Pages: 392 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( May 2009 )