MEMORY TECHNOLOGY, DESIGN AND TESTING. IEEE INTERNATIONAL WORKSHOP. 2009. (MTDT 2009)

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006371
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  • Title: 2009 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2009)
  • Date/Location: Held 31 August - 2 September 2009, Hsinchu, Taiwan.
  • IEEE #: CFP09028-POD
  • ISBN: 9781424451852
  • Pages: 93 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Nov 2009 )

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  • Title: 2009 IEEE International Workshop on Memory Technology, Design and Testing (MTDT 2009)
  • Date/Location: Held 31 August - 2 September 2009, Hsinchu, Taiwan.
  • IEEE #: CFP09028-POD
  • ISBN: 9781424451852
  • Pages: 93 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Nov 2009 )