Details
- Title: 2009 International Test Conference (ITC 2009)
- Date/Location: Held 1-6 November 2009, Austin, Texas, USA.
- IEEE #: CFP09ITC-POD
- ISBN: 9781424448685
- Pages: 639 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2010 )
Description
Members/Attendees
Tab 4
- Title: 2009 International Test Conference (ITC 2009)
- Date/Location: Held 1-6 November 2009, Austin, Texas, USA.
- IEEE #: CFP09ITC-POD
- ISBN: 9781424448685
- Pages: 639 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2010 )