DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS. IEEE INTERNATIONAL SYMPOSIUM. 24TH 2009. (DFT 2009)

DEFECT AND FAULT TOLERANCE IN VLSI SYSTEMS. IEEE INTERNATIONAL SYMPOSIUM. 24TH 2009. (DFT 2009)

Item #:
007041
$109.00 - $218.00
Adding to cart… The item has been added

Details

  • Title: 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2009)
  • Date/Location: Held 7-9 October 2009, Chicago, Illinois, USA.
  • IEEE #: CFP09078-POD
  • ISBN: 9781424452989
  • Pages: 451 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Feb 2010 )

Description

 

Members/Attendees

 

Tab 4

 
  • Title: 2009 24th IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems (DFT 2009)
  • Date/Location: Held 7-9 October 2009, Chicago, Illinois, USA.
  • IEEE #: CFP09078-POD
  • ISBN: 9781424452989
  • Pages: 451 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Feb 2010 )