Details
- Title: 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010)
- Date/Location: Held 5-9 July 2010, Singapore.
- IEEE #: CFP10777-POD
- ISBN: 9781424455966
- Pages: 364 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Sep 2010 )
Description
Members/Attendees
Tab 4
- Title: 2010 17th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2010)
- Date/Location: Held 5-9 July 2010, Singapore.
- IEEE #: CFP10777-POD
- ISBN: 9781424455966
- Pages: 364 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Sep 2010 )