Details
- Title: 2010 19th IEEE Asian Test Symposium (ATS 2010)
- Date/Location: Held 1-4 December 2010, Shanghai, China.
- IEEE #: CFP10067-POD
- ISBN: 9781424488414
- Pages: 463 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Apr 2011 )
Description
Members/Attendees
Tab 4
- Title: 2010 19th IEEE Asian Test Symposium (ATS 2010)
- Date/Location: Held 1-4 December 2010, Shanghai, China.
- IEEE #: CFP10067-POD
- ISBN: 9781424488414
- Pages: 463 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Apr 2011 )