DEFECT AND FAULT TOLERANCE IN VLSI AND NANOTECHNOLOGY SYSTEMS. IEEE INTERNATIONAL SYMPOSIUM. 2011. (DFT 2011)

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013625

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Title: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011)
Date/Location: Held 3-5 October 2011, Vancouver, British Columbia, Canada.
IEEE #: CFP11078-POD
ISBN: 9781457717130
Pages: 482 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
POD Publisher: Curran Associates, Inc. ( Jan 2012 )

Title: 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT 2011)
Date/Location: Held 3-5 October 2011, Vancouver, British Columbia, Canada.
IEEE #: CFP11078-POD
ISBN: 9781457717130
Pages: 482 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: Institute of Electrical and Electronics Engineers (IEEE)
POD Publisher: Curran Associates, Inc. ( Jan 2012 )