Details
- Title: 2011 IEEE International Test Conference (ITC 2011)
- Date/Location: Held 20-22 September 2011, Anaheim, California, USA.
- IEEE #: CFP11ITC-POD
- ISBN: 9781457701535
- Pages: 508 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Mar 2012 )
Description
Members/Attendees
Tab 4
- Title: 2011 IEEE International Test Conference (ITC 2011)
- Date/Location: Held 20-22 September 2011, Anaheim, California, USA.
- IEEE #: CFP11ITC-POD
- ISBN: 9781457701535
- Pages: 508 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Mar 2012 )