Details
- Title: 2014 IEEE 32nd VLSI Test Symposium (VTS 2014)
- Date/Location: Held 13-17 April 2014, Napa, California, USA.
- IEEE #: CFP14029-POD
- ISBN: 9781479926121
- Pages: 293 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jul 2014 )
Description
Members/Attendees
Tab 4
- Title: 2014 IEEE 32nd VLSI Test Symposium (VTS 2014)
- Date/Location: Held 13-17 April 2014, Napa, California, USA.
- IEEE #: CFP14029-POD
- ISBN: 9781479926121
- Pages: 293 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jul 2014 )