COPPER INTERCONNECTS, NEW CONTACT AND BARRIER METALLURGIES/STRUCTURES, AND LOW-K INTERLEVEL DIELECTRICS III. (AT 208TH ECS MEETING)

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  • Title: Copper Interconnects, New Contact and Barrier Metallurgies/Structures, and Low-k Interlevel Dielectrics III
  • Subtitle: Held at 208TH ECS Meeting
  • Date/Location: Held 16-21 October 2005, Los Angeles, California.
  • Series: ECS Transactions Volume 1 No.11
  • Editor: Mathad, G.
  • ISBN: 9781566774994
  • Pages: 186 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Electrochemical Society (ECS)
  • POD Publisher: Curran Associates, Inc. ( Dec 2006 )

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  • Title: Copper Interconnects, New Contact and Barrier Metallurgies/Structures, and Low-k Interlevel Dielectrics III
  • Subtitle: Held at 208TH ECS Meeting
  • Date/Location: Held 16-21 October 2005, Los Angeles, California.
  • Series: ECS Transactions Volume 1 No.11
  • Editor: Mathad, G.
  • ISBN: 9781566774994
  • Pages: 186 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Electrochemical Society (ECS)
  • POD Publisher: Curran Associates, Inc. ( Dec 2006 )