CHARACTERIZATION OF OXIDE/SEMICONDUCTOR INTERFACES FOR CMOS TECHNOLOGIES. (SYMPOSIUM H AT THE 2007 MRS SPRING MEETING)

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003328

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Title: Characterization of Oxide/Semiconductor Interfaces for CMOS Technologies
Subtitle: Symposium H at the 2007 MRS Spring Meeting
Date/Location: Held 9-13 April 2007, San Francisco, California.
Series: Materials Research Society Symposium Proceedings Volume 996
ISBN: 9781605604282
Pages: 174 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: Cambridge University Press (CUP) / Materials Research Society (MRS)
POD Publisher: Curran Associates, Inc. ( Nov 2008 )

Title: Characterization of Oxide/Semiconductor Interfaces for CMOS Technologies
Subtitle: Symposium H at the 2007 MRS Spring Meeting
Date/Location: Held 9-13 April 2007, San Francisco, California.
Series: Materials Research Society Symposium Proceedings Volume 996
ISBN: 9781605604282
Pages: 174 (1 Vol)
Format: Softcover
TOC Link: View Table of Contents
Publisher: Cambridge University Press (CUP) / Materials Research Society (MRS)
POD Publisher: Curran Associates, Inc. ( Nov 2008 )