INTEGRATED RELIABILITY WORKSHOP. IEEE INTERNATIONAL. 2010. (FINAL REPORT) (IRW 2010)

INTEGRATED RELIABILITY WORKSHOP. IEEE INTERNATIONAL. 2010. (FINAL REPORT) (IRW 2010)

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010621
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Details

  • Title: 2010 IEEE International Integrated Reliability Workshop Final Report (IRW 2010)
  • Date/Location: Held 17-21 October 2010, S. Lake Tahoe, California, USA.
  • IEEE #: CFP10IRW-POD
  • ISBN: 9781424485215
  • Pages: 180 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Apr 2011 )

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  • Title: 2010 IEEE International Integrated Reliability Workshop Final Report (IRW 2010)
  • Date/Location: Held 17-21 October 2010, S. Lake Tahoe, California, USA.
  • IEEE #: CFP10IRW-POD
  • ISBN: 9781424485215
  • Pages: 180 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Apr 2011 )