RELIABILITY, SAFETY AND HAZARD - RISK-BASED TECHNOLOGIES AND PHYSICS-OF-FAILURE METHODS. INTERNATIONAL CONFERENCE. 2ND 2010. (ICRESH 2010)

RELIABILITY, SAFETY AND HAZARD - RISK-BASED TECHNOLOGIES AND PHYSICS-OF-FAILURE METHODS. INTERNATIONAL CONFERENCE. 2ND 2010. (ICRESH 2010)

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  • Title: 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH 2010)
  • Date/Location: Held 14-16 December 2010, Mumbai, India.
  • Editor: Varde, P. V.
  • IEEE #: CFP1082K-POD
  • ISBN: 9781424483440
  • Pages: 651 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jun 2011 )

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  • Title: 2010 2nd International Conference on Reliability, Safety and Hazard - Risk-Based Technologies and Physics-of-Failure Methods (ICRESH 2010)
  • Date/Location: Held 14-16 December 2010, Mumbai, India.
  • Editor: Varde, P. V.
  • IEEE #: CFP1082K-POD
  • ISBN: 9781424483440
  • Pages: 651 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jun 2011 )