TEST CONFERENCE. IEEE INTERNATIONAL. 2011. (ITC 2011) (CD-ROM)

TEST CONFERENCE. IEEE INTERNATIONAL. 2011. (ITC 2011) (CD-ROM)

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014169
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Details

  • Title: 2011 IEEE International Test Conference (ITC 2011)
  • Date/Location: Held 20-22 September 2011, Anaheim, California, USA.
  • IEEE #: CFP11ITC-CDR
  • ISBN: 9781457701511
  • Format: CD-ROM
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Feb 2012 )

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Tab 4

 
  • Title: 2011 IEEE International Test Conference (ITC 2011)
  • Date/Location: Held 20-22 September 2011, Anaheim, California, USA.
  • IEEE #: CFP11ITC-CDR
  • ISBN: 9781457701511
  • Format: CD-ROM
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Feb 2012 )