FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS. INTERNATIONAL CONFERENCE. 2011. (2011 FCMN)

FRONTIERS OF CHARACTERIZATION AND METROLOGY FOR NANOELECTRONICS. INTERNATIONAL CONFERENCE. 2011. (2011 FCMN)

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  • Title: Frontiers of Characterization and Metrology for Nanoelectronics: 2011
  • Date/Location: Held 23-26 May 2011, Grenoble, France.
  • Series: AIP Conference Proceedings Volume 1395
  • Editor: Seiler, D. G.
  • ISBN: 9781629938578
  • Pages: 377 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: American Institute of Physics (AIP)
  • POD Publisher: Curran Associates, Inc. ( Feb 2014 )

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  • Title: Frontiers of Characterization and Metrology for Nanoelectronics: 2011
  • Date/Location: Held 23-26 May 2011, Grenoble, France.
  • Series: AIP Conference Proceedings Volume 1395
  • Editor: Seiler, D. G.
  • ISBN: 9781629938578
  • Pages: 377 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: American Institute of Physics (AIP)
  • POD Publisher: Curran Associates, Inc. ( Feb 2014 )