LOW-VOLTAGE ELECTRON MICROSCOPY AND SPECTROSCOPY FOR MATERIALS CHARACTERIZATION. (SYMPOSIUM YY AT THE 2012 MRS FALL MEETING AND EXHIBIT)

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  • Title: Low-Voltage Electron Microscopy and Spectroscopy for Materials Characterization
  • Subtitle: Symposium YY at the 2012 MRS Fall Meeting and Exhibit
  • Date/Location: Held 25-30 November 2012, Boston, Massachusetts, USA.
  • Series: Materials Research Society Symposium Proceedings Volume 1531
  • Editor: Egerton, R.
  • ISBN: 9781632661210
  • Pages: 12 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Cambridge University Press (CUP) / Materials Research Society (MRS)
  • POD Publisher: Curran Associates, Inc. ( Apr 2014 )

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  • Title: Low-Voltage Electron Microscopy and Spectroscopy for Materials Characterization
  • Subtitle: Symposium YY at the 2012 MRS Fall Meeting and Exhibit
  • Date/Location: Held 25-30 November 2012, Boston, Massachusetts, USA.
  • Series: Materials Research Society Symposium Proceedings Volume 1531
  • Editor: Egerton, R.
  • ISBN: 9781632661210
  • Pages: 12 (1 Vol)
  • Format: Softcover
  • TOC Link: View Table of Contents
  • Publisher: Cambridge University Press (CUP) / Materials Research Society (MRS)
  • POD Publisher: Curran Associates, Inc. ( Apr 2014 )