Details
- Title: 2015 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM 2015)
- Date/Location: Held 22-23 October 2015, Beijing, China.
- IEEE #: CFP15ENM-POD
- ISBN: 9781467379007
- Pages: 276 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jan 2016 )
Description
Members/Attendees
Tab 4
- Title: 2015 ACM/IEEE International Symposium on Empirical Software Engineering and Measurement (ESEM 2015)
- Date/Location: Held 22-23 October 2015, Beijing, China.
- IEEE #: CFP15ENM-POD
- ISBN: 9781467379007
- Pages: 276 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jan 2016 )