Details
- Title: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2016)
- Date/Location: Held 18-21 July 2016, Singapore.
- IEEE #: CFP16777-USB
- ISBN: 9781467382588
- Format: USB
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Oct 2016 )
Description
Members/Attendees
Tab 4
- Title: 2016 IEEE 23rd International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2016)
- Date/Location: Held 18-21 July 2016, Singapore.
- IEEE #: CFP16777-USB
- ISBN: 9781467382588
- Format: USB
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Oct 2016 )