Details
- Title: 2016 IEEE International Test Conference (ITC 2016)
- Date/Location: Held 15-17 November 2016, Fort Worth, Texas, USA.
- IEEE #: CFP16ITC-POD
- ISBN: 9781467387743
- Pages: 490 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2017 )
Description
Members/Attendees
Tab 4
- Title: 2016 IEEE International Test Conference (ITC 2016)
- Date/Location: Held 15-17 November 2016, Fort Worth, Texas, USA.
- IEEE #: CFP16ITC-POD
- ISBN: 9781467387743
- Pages: 490 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2017 )