Details
- Title: 2016 IEEE/ACM 1st International Workshop on Metamorphic Testing (MET 2016)
- Date/Location: Held 16 May 2016, Austin, Texas, USA.
- IEEE #: CFP16G11-POD
- ISBN: 9781509001309
- Pages: 48 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2017 )
Description
Members/Attendees
Tab 4
- Title: 2016 IEEE/ACM 1st International Workshop on Metamorphic Testing (MET 2016)
- Date/Location: Held 16 May 2016, Austin, Texas, USA.
- IEEE #: CFP16G11-POD
- ISBN: 9781509001309
- Pages: 48 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2017 )