Details
- Title: 2017 IEEE 35th VLSI Test Symposium (VTS 2017)
- Date/Location: Held 9-12 April 2017, Las Vegas, Nevada, USA.
- IEEE #: CFP17029-USB
- ISBN: 9781509044818
- Format: USB
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jul 2017 )
Description
Members/Attendees
Tab 4
- Title: 2017 IEEE 35th VLSI Test Symposium (VTS 2017)
- Date/Location: Held 9-12 April 2017, Las Vegas, Nevada, USA.
- IEEE #: CFP17029-USB
- ISBN: 9781509044818
- Format: USB
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jul 2017 )