Details
- Title: 2017 IEEE International Conference on Software Testing, Verification and Validation (ICST 2017)
- Date/Location: Held 13-17 March 2017, Tokyo, Japan.
- IEEE #: CFP17TVV-POD
- ISBN: 9781509060320
- Pages: 554 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jun 2017 )
Description
Members/Attendees
Tab 4
- Title: 2017 IEEE International Conference on Software Testing, Verification and Validation (ICST 2017)
- Date/Location: Held 13-17 March 2017, Tokyo, Japan.
- IEEE #: CFP17TVV-POD
- ISBN: 9781509060320
- Pages: 554 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jun 2017 )