Details
- Title: 2017 International Conference on Software Analysis, Testing and Evolution (SATE 2017)
- Date/Location: Held 3-4 November 2017, Harbin, China.
- IEEE #: CFP17J04-POD
- ISBN: 9781538636886
- Pages: 90 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jan 2018 )
Description
Members/Attendees
Tab 4
- Title: 2017 International Conference on Software Analysis, Testing and Evolution (SATE 2017)
- Date/Location: Held 3-4 November 2017, Harbin, China.
- IEEE #: CFP17J04-POD
- ISBN: 9781538636886
- Pages: 90 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jan 2018 )