Details
- Title: 2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO 2017)
- Date/Location: Held 7-11 August 2017, Shanghai, China.
- IEEE #: CFP173MN-USB
- ISBN: 9781538610800
- Format: USB
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Apr 2018 )
Description
Members/Attendees
Tab 4
- Title: 2017 IEEE International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO 2017)
- Date/Location: Held 7-11 August 2017, Shanghai, China.
- IEEE #: CFP173MN-USB
- ISBN: 9781538610800
- Format: USB
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Apr 2018 )