Details
- Title: 2018 IEEE 27th Asian Test Symposium (ATS 2018)
- Date/Location: Held 15-18 October 2018, Hefei, China.
- IEEE #: CFP18067-POD
- ISBN: 9781538694671
- Pages: 216 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2019 )
Description
Members/Attendees
Tab 4
- Title: 2018 IEEE 27th Asian Test Symposium (ATS 2018)
- Date/Location: Held 15-18 October 2018, Hefei, China.
- IEEE #: CFP18067-POD
- ISBN: 9781538694671
- Pages: 216 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2019 )