Details
- Title: 2018 IEEE International Test Conference (ITC 2018)
- Date/Location: Held 29 October - 1 November 2018, Phoenix, Arizona, USA.
- IEEE #: CFP18ITC-POD
- ISBN: 9781538683835
- Pages: 547 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2019 )
Description
Members/Attendees
Tab 4
- Title: 2018 IEEE International Test Conference (ITC 2018)
- Date/Location: Held 29 October - 1 November 2018, Phoenix, Arizona, USA.
- IEEE #: CFP18ITC-POD
- ISBN: 9781538683835
- Pages: 547 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Feb 2019 )