Details
- Title: 2019 IEEE International Conference On Artificial Intelligence Testing (AITest 2019)
- Date/Location: Held 4-9 April 2019, Newark, California, USA.
- IEEE #: CFP19S64-POD
- ISBN: 9781728104935
- Pages: 166 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jul 2019 )
Description
Members/Attendees
Tab 4
- Title: 2019 IEEE International Conference On Artificial Intelligence Testing (AITest 2019)
- Date/Location: Held 4-9 April 2019, Newark, California, USA.
- IEEE #: CFP19S64-POD
- ISBN: 9781728104935
- Pages: 166 (1 Vol)
- Format: Softcover
- TOC Link: View Table of Contents
- Publisher: Institute of Electrical and Electronics Engineers (IEEE)
- POD Publisher: Curran Associates, Inc. ( Jul 2019 )