VLSI TEST SYMPOSIUM. IEEE. 37TH 2019. (VTS 2019) (USB)

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049231
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Details

  • Title: 2019 IEEE 37th VLSI Test Symposium (VTS 2019)
  • Date/Location: Held 23-25 April 2019, Monterey, California, USA.
  • IEEE #: CFP19029-USB
  • ISBN: 9781728111698
  • Format: USB
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jul 2019 )

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Tab 4

 
  • Title: 2019 IEEE 37th VLSI Test Symposium (VTS 2019)
  • Date/Location: Held 23-25 April 2019, Monterey, California, USA.
  • IEEE #: CFP19029-USB
  • ISBN: 9781728111698
  • Format: USB
  • Publisher: Institute of Electrical and Electronics Engineers (IEEE)
  • POD Publisher: Curran Associates, Inc. ( Jul 2019 )